Nanomaterial Growth
Furnace 1
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Furnace 2
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In-situ TEM Electrical/Heating Holder
Protochip Holder with Ceramic Substrate
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TEM Sample Preparation
Multiprep Polisher
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Diamond Saw, Stereoscope  |
Sample Handling and Characterization
Glovebox
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Olympus microscope
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Device Transport (Room T)
Probe Station
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Device Fabrication
Thermal Evaporator (ESI equipment) |
Spin Coater
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Shared Facilities
YINQE
- Tecnai Osiris S/TEM with a four-quadrant EDX detector and EELS
- Hitachi and FEI SEMs
- FEI dual-beam focused ion beam
- Tecnai F20 with EDX and tomography (Medical school)
- Vistec e-beam lithography
SEAS Cleanroom
- photolithography
- metal/dielectric deposition, etc.
CRISP
- Physcial property measurement system (PPMS, 9 T, 2 K)
- SQUID
MCC (Materials Characterization Core)
This facility is housed in the Energy Sciences Center II at West Campus.
- Hitachi cold-FEG SEM (SU8230) with a quadrant EDX detector and STEM detector
- Raman spectroscopy
- XPS with a 10 micron spot size (PHI VersaProbe II Scanning XPS microprobe)
- XRD (Rigaku SmartLab X-ray Diffractometer)
- XRF (Rigaku ZSX Primus II XRF Spectrometer)
- Physical property measurement system (Dynacool, 14 T, 2 K)
(Our group has a 300 mK insert that works with Dynacool)
- Wire bonder