Atomic Force Microscope for Measurements under Ambient Conditions and in Liquids

Nanoscope ambient conditions AFM - Overall setup		Commercial ambient conditions AFM

For measurements under ambient conditions and in liquids, ex-situ checks of samples, and student training, the Yale Nanomechanics Group has a commercial Nanoscope Multimode atomic force microscope and a Nanoscope IIIa electronics available. For more information, please visit the web page of the manufacturer, Veeco Instruments.