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Atomic Force Microscope for Measurements under Ambient Conditions and in Liquids

Ambient AFM - Overview   Ambient AFM
Nanoscope ambient conditions AFM - Overall setup
 
Commercial ambient conditions AFM



For measurements under ambient conditions and in liquids, ex-situ checks of samples, and student training, the Yale Nanomechanics Group has a commercial Nanoscope Multimode atomic force microscope and a Nanoscope IIIa electronics available. For more information, please visit the web page of the manufacturer, Veeco Instruments.