T.P. Ma
Raymond John Wean Professor
Dept. of Electrical Engineering
Yale University
New Haven, CT 06520-8284
Phone: 203-432-4211
Fax: 203-432-7769
Email: t.ma@yale.edu

Christine Caragianis Broadbridge
Visiting Fellow

Education Director, CRISP
Professor of Physics,
Southern Connecticut State University
501 Crescent Street; Jennings 119
New Haven, CT 06515-1355
Office: 203-392-6461
Lab: 203-392-7018
Fax: 203-392-6466



Dr. Broadbridge received Ph. D. and M. S. degrees in Engineering from Brown University where she conducted research in the fields of materials science, semiconductor electronics and solid -state physics. She immediately joined the faculty in the Department of Engineering at Trinity College in Hartford, Connecticut where she established a materials processing and characterization facility supporting undergraduate research. During this time, she also founded and directed the United Technologies/Trinity College Engineering Initiative (UTCEI).

In January of 1998, Dr. Broadbridge was appointed Visiting Fellow at Yale University and in September of 2000 she joined the faculty at Southern Connecticut State University (SCSU) also in New Haven. The Physics Department at SCSU represented an ideal match to Dr. Broadbridge's interests -- a very strong research focus on materials science and condensed matter physics.

Since joining SCSU Dr. Broadbridge has established a materials characterization facility that has been successfully employed for solid-state research. Her most recent project includes the establishment of the CRISP NanoCharacterization Facility at SCSU for research and education.
Dr. Broadbridge's continued participation in outreach efforts are facilitated by her many contacts in academia, industry and in urban school districts as well as her position as Education Director for the Center for Research on Interface Structures and Phenomena (CRISP) which is an NSF funded Materials Research Science and Engineering Center (MRSEC).

Research Summary

Established and managed research group supporting: (1) advanced analytical techniques for structural, chemical and electrical characterization of thin film and nanocrystalline materials; (2) electron and scanning probe microscopy for evaluation of structure-property relationships; (3) processing of materials for microelectronic and optoelectronic applications. Collaborators include faculty and students from Southern Connecticut State University, Yale University, University of Connecticut and Trinity College.


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