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Contact us
Yale University
Yale Engineering
Yale Electrical Engineering
Yale Applied Physics
Yale University
Center for Microelectronic
Materials and Structures
P.O. Box 208284
New Haven
CT 06520-8284
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Optical Characterization Laboratory
Optical characterization laboratory in µELM is for measuring optical properties of semiconductors
and their device structures.
Faculty
Facility pictures
Copyright
© 2001, Yale University, New Haven,
Connecticut, USA.
All rights reserved.
Site made by Takhee Lee.
Comments or suggestions to Arlene A. Ciociola.
Last modified: August 4, 2001.
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