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Yale University
Yale Engineering
Yale Electrical Engineering
Yale Applied Physics
Yale University
Center for Microelectronic
Materials and Structures
P.O. Box 208284
New Haven
CT 06520-8284
Electronic Device Characterization Laboratory
Electronic device characterization laboratory in µELM is for measuring electronic properties of semiconductor devices.
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Copyright © 2001, Yale University, New Haven, Connecticut, USA.
All rights reserved.
Site made by Takhee Lee.
Comments or suggestions to Arlene A. Ciociola.
Last modified: August 4, 2001.