Research
The continuous advancement of semiconductor and communication technologies has enabled electronic circuits and systems to penetrate and fundamentally impact every facet of contemporary life, ranging from commodity devices (e.g. mobile phones) to mission-critical applications (e.g. medical equipment). While malfunctions in the former may cause no harm other than inconvenience, the slightest malfunction in the latter may have catastrophic consequences. Inevitably, frequent occurrence of malfunctions is a fact of life, instigated either by permanent failure causes (e.g. manufacturing defects, environmental wear-&-tear), or by transient error sources (e.g. electromagnetic interference, cosmic radiation). Therefore, ensuring the quality of electronic circuits and systems through effective post-fabrication testing, as well as their reliability through error detection and mitigation methods, is paramount. Addressing these problems becomes particularly important as the current Complementary Metal–Oxide–Semiconductor (CMOS) technology is aggressively scaled to its limits. Indeed, emerging technologies do not enjoy the fabrication precision that we are accustomed to in CMOS and are expected to remain significantly less controllable, hence depending on robust test and reliability methods to yield circuits and systems that operate correctly. Motivated by the above observations, the interests of our research group lie in the area of Testable and Reliable Architectures for Integrated Circuits and Systems. Our aim is to facilitate the realization of high-quality, reliable electronics, thereby extending their deployment in a broad range of applications, enabling reliable computing, fostering technology trustworthiness and, by extension, improving quality of life.
The novelty of our research lies in the amalgamation of formal methods with state-of-the-art practices, resulting in the development of practical yet theoretically rooted and analytically supported solutions for designing testable and reliable electronic circuits and systems. Our efforts focus mainly on analog/RF and asynchronous circuits, for which test and reliability technology is not up to par with their digital and synchronous counterparts, yet we also develop solutions for contemporary problems in the digital domain as well as for emerging technologies.
Click on the following links, for more information on our key contributions, as well as our current activities and future research plans on each of these topics:.
Test
& Reliability Solutions for Analog/RF Circuits
Test & Reliability Solutions for Asynchronous
Circuits
