Testable and Reliable Architectures


	People Faculty: Yiorgos Makris Associate Professor of Electrical Engineering and Computer Science Research Interests: Test & Reliability of Digital and Analog Systems Current Graduate Students: He (Bryan) Huang 3rd year Ph.D. Student Research Interests: Built-In Self Test in Analog/RF Circuits Yier Jin 2nd year Ph.D. Student Research Interests: Hardware Trojans Nathan Kupp 2nd Year Ph.D. Student *(Recipient of SRC Fellowship)* Research Interests: Machine Learning Methods for Testing Analog/RF Circuits Michail Maniatakos 2nd year Ph.D. Student Research Interests: RTL Simulation and its Applications in Modern Microprocessors Dzmitry Maliuk 1st Year Ph.D. Student Research Interests: Concurrent Error Detection and Self-Healing in Analog Circuits Visiting Graduate Student: Naghmeh Karimi 6th year Ph.D. Student at the University of Tehran, Iran Research Interests: RTL Concurrent Error Detection in Modern Microprocessors Graduated Ph.D Students: Dr. Feng Shi Ph.D. in Electrical Engineering, 2007 Thesis Title: Optimization Frameworks for Designing Reliable Circuits Current Position: Mixed-Signal/RF Designer, Skyworks Solutions, Irvine, CA, USA Dr. Sobeeh Almukhaizim Ph.D. in Electrical Engineering, 2007 Thesis Title: Optimization Frameworks for Designing Reliable Circuits Current Position: Faculty of Computer Engineering, Kuwait University, Kuwait Dr. Haralampos Stratigopoulos Ph.D. in Electrical Engineering, 2006 Thesis Title: A Machine Learning Approach to Analog/RF Circuit Testing Current Position: CNRS Researcher, TIMA Laboratory, Grenoble, France Graduated M.S. Student: Thomas Verdel MS in Electrical Engineering, 2002 Topic: Concurrent Error Detection in Asynchronous Circuits Current Position: Quantitative Portfolio Manager, AXIA Investments, Tulsa, OK, USA Current Undergraduate Students: None currently, openings available Undergraduate Alumni: Eric Love Research Project in Electrical Engineering *(NSF REU)* Topic: Soft-Error Tolerant Gate-Decomposition in ABMMs Kyle Gong Research Project in Electrical Engineering *(Intel Gift)* Topic: Synthesis for Reliability using SPFDs James Dardig Senior Project in Electrical Engineering, 2008 Topic: Statistical Characterization of Functionalized Nanowire Populations Research Project in Electrical Engineering, 2002 *(NSF REU)* Topic: Machine Learning-Based Nanoscale Architectures John Kearny Senior Project in Electrical Engineering, 2007 Topic: Mixed-Signal Test Methods on a Cypress PSOC Device Sam Evers Senior Project in Electrical Engineering, 2005 Topic: Feature Selection Algorithms for Analog Circuit Testing Research Project in Electrical Engineering, 2004 *(Dean’s Fellowship)* Topic: Concurrent Error Detection with Latency in FSMs Amy Wong Senior Project in Electrical Engineering, 2004 Topic: Implementation of an Adaptive Floating Search Method in C++ Melis Kahya Senior Project in Electrical Engineering, 2004 Topic: Oscilaltion Test with Amplitude Considerations Abraham Tarapani Senior Project in Electrical Engineering, 2004 Topic: Design and Implementation of an Advanced Toy Processor on an FPGA Xin Tong Research Project in Computer Science, 2004 Topic: Implementation of an Educational Toy Processor on the Pegasus Board Nitin Gupta Research Project in Computer Science, 2004 Topic: In-Depth Analysis of the Compaction of Sequential Test Sequences Konstantinos Rokas Senior Project in Electrical Engineering, 2003 (Awarded Franz Teteur Prize) Topic: Low-Cost Concurrent Error Detection in FSMs using Convolutional Codes Research Project in Electrical Engineering, 2002 Topic: Concurrent Error Detection with Latency in FSMs Travis Penn Undergraduate Research Project in Computer Science, 2003 Topic: Test Response Compaction Emmanuel Imbeah Undergraduate Research Project in Computer Science, 2003 Topic: Design of an Educational Toy Processor Andrew Barton-Sweeney Senior Project in Electrical Engineering and Computer Science, 2002 Topic: IP/UDP FPGA Hardware Implementation (co-advised with Prof. Richard Yang) Raul Ruiz Research Project in Electrical Engineering, 2002 Topic: Concurrent Test Methods for Combinational Circuits