Mark A. Reed Group
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PUBLICATIONS


||  Before 1990    ||  1990  ||  1991  ||  1992  ||  1993  ||  1994  ||  1995  ||

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|| 2004  ||  2005  ||  2006  || 2007 ||  Talks  ||


BOOKS

Molecular Nanolectronics, edited by M. A. Reed and T. Lee, (American Scientific Publishers, 2003).

BOOK CHAPTERS

W. Wang, T. Lee, M. Kamdar, M.A. Reed, M. P. Steward, J. J. Huang, and J. M. Tour, “Electrical Characterization of Metal-Molecule-Silicon Junctions”, Molecular Electronics III, Ann. N.Y. Acad. Sci. 1006, pp. 36-47 (2003). [pdf]

T. Lee, W. Wang, M.A. Reed, “Mechanism of Electron Conduction In Self-Assembled Alkanethiol Monolayer Devices”, Molecular Electronics III, Ann. N.Y. Acad. Sci. 1006, pp. 21–35 (2003). [pdf]

J. Chen, T. Lee, J. Su, W. Wang, M.A. Reed, A.M. Rawlett, M. Kozaki, Y. Yao, R. C. Jagessar, S. M. Dirk, D. W. Price, J. M. Tour, D.S. Grubisha, and D. W. Bennett, “Molecular Electronic Devices”, Molecular Nanolectronics, edited by M. A. Reed and T. Lee, (American Scientific Publishers, 2003).  [pdf]


JOURNAL ARTICLES

J. Chen, J. Su, W. Wang, and M. A. Reed, “Electronic Memory Effects in Self-Assembled Monolayer Systems”, Physica E 16, 17 (2003). [pdf]

Wenyong Wang, Takhee Lee, and M. A. Reed, “Characterization of Electron Tunneling In Self-Assembled Alkanethiol Monolayer Devices”, Physica E 19, 117 (2003) [pdf]

W. Wang, T. Lee, M. Kamdar, M.A. Reed, M.P. Stewart, J.-J. Hwang, J.M. Tour, “Electrical characterization of metal-molecule-silicon junctions”, Superlattices and Microstructures 33, 217 (2003). [pdf]

Wenyong Wang, Takhee Lee, and M. A. Reed, “Characterization of Electron Tunneling In Self-Assembled Alkanethiol Monolayer Devices”, Phys. Rev. B 68, 035416 (2003)   [pdf]

Guosheng Cheng, Andrei Kolmakov, Youxiang Zhang, Martin Moskovits,
Ryan Munden, Mark A. Reed, Guangming Wang, Daniel Moses, and Jinping Zhang, "Current rectification in a single GaN nanowire with a well-defined p-n junction", Appl. Phys. Lett. 83, 1578 (2003). [pdf]

Flatt AK, Dirk SM, Henderson JC, Shen DE, Su J, Reed MA, Tour JM, “Synthesis and testing of new end-functionalized oligomers for molecular electronics”, Tetrahedron 59, 8555(2003). [pdf]

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PATENTS (granted)

US6608386 08/19/2003 Sub-nanoscale electronic devices and processes

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Mark A. Reed Group