Yale


Sponsors:

Conference on Noncontact Atomic Force Microscopy

Scope

Non-Contact Atomic Force Microscopy (NC-AFM) is a dynamic scanning force microscopy technique that has fulfilled the long-standing goal of true atomic resolution imaging on metal, semiconductor and insulating surfaces. While traditionally performed in ultrahigh vacuum, recent developments have extended its high-resolution capabilities to technologically relevant environments, including liquids, biological solutions and ambient conditions. The conference in New Haven, CT, USA continues the series of international conferences that have begun in 1998 in Osaka, Japan, and continued Pontresina, Switzerland (1999), Hamburg, Germany (2000), Kyoto, Japan (2001), Montreal, Canada (2002), Dingle, Ireland (2003), Seattle, USA (2004), Bad Essen, Germany (2005), Kobe, Japan (2006), Antalya, Turkey (2007), and Madrid, Spain (2008). The conference covers experimental, theoretical, and instrumental contributions on frequency modulation and other dynamic operation modes that focus on achieving the highest resolution in imaging and force spectroscopy of any well prepared surface. The conference welcomes contributions dealing with one or more of the following topics:

  1. Atomic resolution imaging of surfaces, thin films, and molecular systems
  2. Measuring tip-sample interaction potentials and mapping force fields
  3. High-resolution imaging of clusters, biomolecules, and biological systems
  4. High-resolution imaging and spectroscopy in liquid environments
  5. Novel instrumentation and measurement techniques in dynamic AFM
  6. Small amplitude measurements
  7. Lateral force measurements using dynamic methods
  8. Atomic- and molecular-scale manipulation
  9. Theoretical analysis of contrast mechanisms; forces & tunnelling phenomena
  10. Simulation of images and virtual AFM systems
  11. Mechanisms for damping and energy dissipation
  12. Amplitude modulation versus frequency modulation imaging
  13. Measuring nanoscale charges, work functions, and magnetic properties
  14. Characterization and modification of force microscopy tips at the atomic scale