12th International Conference on
Noncontact Atomic Force Microscopy

Yale University, New Haven, CT, USA, August 10-14, 2009

 

News: Information on the conference venue (conference hall) can be found here. Full Program information, including a PDF of the abstract booklet, has been made available. Information on conference proceedings (to appear in the Journal of Vacuum Science and Technology B) has been published. You can download a pdf of the conference flyer here.

Notes:
The conference banquet has been moved from its original Thursday slot to a new slot on Wednesday 18:30-22:00 due to scheduling issues at Sterling Main Library.

 

The NC-AFM 2009 continues a series of international conferences that cover experimental, theoretical, and instrumental contributions on frequency modulation and other dynamic operation modes of the atomic force microscope with particular emphasis on high resolution imaging and force spectroscopy of any well-prepared surface (>>> Scope).

The scientific sessions of NC-AFM 2009 will run from Tuesday, August 11th, 9:00 am to Friday, August 14th, 2009, 12:40 pm. A satellite workshop devoted to Casimir forces and their measurement will overlap with the conference with specialized sessions on Monday, August 10th and common sessions on force spectroscopy on Tuesday, August 11th, 2009. Participation is free if attending the main conference.

 

The NC-AFM conference is hosted by: