Talks and Posters

Last Update: September 6, 2008


1.  Invited Talks at Conferences

  1. U. D. Schwarz, W. Allers, G. Gensterblum, and R. Wiesendanger. Low-load friction behavior of epitaxial C60 monolayers under Hertzian contact. Adriatico Research Conference on Physics of Sliding Friction, NATO ASI Series, Trieste, Italy, June 20-23, 1995.
  2. U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, P. Köster, W. Allers, A. Schwarz, and R. Wiesendanger. Experimental and theoretical aspects of point contact friction. Fourth International Conference on Nanometer-scale Science and Technology (NANO IV), Beijing, China, September 8-12, 1996.
  3. U. D. Schwarz, O. Zwörner, and H. Hölscher. Quantitative friction force spectroscopy and the nature of the tip/sample contact in force microscopy. First International Symposium on Scanning Probe Spectroscopy and Related Methods, Poznan, Poland, July 15-18, 1997.
  4. U. D. Schwarz, H. Hölscher, H. Bluhm, O. Zwörner, and R. Wiesendanger. Tip-sample interaction in contact force microscopy. 2nd Seminar on Quantitative Microscopy, (QM2), Vienna, Austria, November 6-7, 1997.
  5. U. D. Schwarz, H. Hölscher, O. Zwörner, and R. Wiesendanger. Nanotribology with the scanning force microscope. 196th Seminar of the WE-Heraeus Foundation on Mathematical Modelling and Analysis of Nonsmooth Dynamical Systems, Bad Honnef, Germany, May 4-8, 1998.
  6. U. D. Schwarz. Film thickness measurement by means of scanning force microscopy (German). 3rd meeting of the working group "Thin films in microsystem technology", German Society of Material Science, thin film division, Technical University of Berlin, Berlin, Germany, July 9-10, 1998.
  7. U. D. Schwarz. Friction on the nanometer scale - Nanotribology by means of scanning force microscopy (German). Spring Conference of the German Physical Society, Münster, Germany, March 22-26, 1999.
  8. U. D. Schwarz. Study of microfriction by AFM. 7th International Symposium on Trends and Applications of Thin Films (TATF' 2000), Nancy, France, March 27-30, 2000.
  9. U. D. Schwarz, H. Hölscher, W. Allers, A. Schwarz, and R. Wiesendanger. Investigation of the mechanics of nanocontacts using a vibrating cantilever technique. NATO ASI workshop on "Fundamentals of and Bridging the Gap between Macro- and Micro/Nanoscale Tribology", Keszthely, Hungary, August 13-25, 2000.
  10. U. D. Schwarz. New applications of scanning force microscopy: From the microscopic origins of friction to high-resolution imaging and spectroscopy at low temperatures. Annual meeting of the French Microscopical Society, Toulouse, September 6-8, 2000.
  11. U. D. Schwarz. Friction on the nanometer scale - Nanotribology by means of scanning force microscopy (German). Workshop on Tribology and Wear, Uhldingen-Mühlhofen, Germany, January 19-21, 2001.
  12. U. D. Schwarz. Single asperity friction from an experimentalist's point of view. CECAM-SIMU-workshop on "Simulation and theory of solid friction: from atomic shear forces to macroscopic tribology", Lyon, France, August 27-30, 2001.
  13. U. D. Schwarz. Scanning force microscopy (German). Heraeus summer school on  "Imaging: From the Atomic Scale to Whole Body Tomography", Halle (Saale), Germany,  September 3-14, 2001.
  14. U.. D. Schwarz. Amontons' law at the nanometer scale: Exploring the atomic origins of friction. ASM International Surface Engineering Congress, Orlando, FL, USA, August 2-4, 2004.
  15. U. D. Schwarz. A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution. Workshop "Frontiers in Scanning Probe Microscopy", West Lafayette, IN, USA, October 4-6, 2006.
  16. U. D. Schwarz, C. Ritter, B. Stegemann, M. Heyde, and K. Rademann. A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution.Moving antimony particles under ambient conditions: The influence of structure, contact area, and surface contamination on friction. 6th ESF-Nanotribology Workshop, Santa Margaritha di Pula, Sardinia, Italy, May 12-16, 2007.
  17. U. D. Schwarz, C. Ritter, D. Dietzel, A. Schirmeisen, and H. Fuchs. Nanoparticle manipulation using scanning probe techniques: A new approach to nanotribology. Fall meeting of the European Materials Research Society, Warsaw, Poland, September 17-21, 2007.
  18. U. D. Schwarz. High-resolution atomic force microscopy: Where are we, and where will the future take us? Materials Science & Technology Conference and Exhibition, Detroit, MI, USA, September 16-20, 2007.
  19. U. D. Schwarz. Three-dimensional force imaging and quantification with atomic resolution. Annual March Meeting of the American Physical Society, New Orleans, LA, USA, March 10-14, 2008.


2.  Talks Given at Universities and Research Institutes
  1. U. D. Schwarz, H. Haefke, E. Meyer, T. A. Jung, R. Steiger, J. Bohonek, G. Gerth, H. Fröb, and W. Sager. Scanning force microscopy at photographic-sensitive systems and oxide nanoparticles (German). University of Basel, Basel, Switzerland, May 14, 1993.
  2. U. D. Schwarz, H. Haefke, E. Meyer, T. A. Jung, R. Steiger, J. Bohonek, G. Gerth, H. Fröb, and W. Sager. Scanning force microscopy at photographic-sensitive systems and oxide nanoparticles (German). University of Hamburg, Hamburg, Germany, June 5, 1993.
  3. U. D. Schwarz. Scanning force microscopy in biology: Applications and selected examples (German). Institute for Molecular Biotechnology, University of Jena, Jena, Germany, January 20, 1994.
  4. U. D. Schwarz, H. Bluhm, W. Allers, and R. Wiesendanger. Friction force microscopy: Approaching the fundamentals of wearless friction. McGill University, Montreal, Canada, August 10, 1995.
  5. U. D. Schwarz, W. Allers, H. Bluhm, H. Hölscher, P. Köster, O. Zwörner, and R. Wiesendanger. Experimental and theoretical aspects of point contact friction (German). University of Konstanz, Konstanz, Germany, May 29, 1996.
  6. U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, P. Köster, W. Allers, and R. Wiesendanger. Experimental and theoretical aspects of point contact friction. Tokyo Institute of Technology, Tokyo, Japan, September 13, 1996.
  7. U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, P. Köster, W. Allers, and R. Wiesendanger. Experimental and theoretical aspects of point contact friction. Advanced Technology Institute, Tokyo, Japan, September 13, 1996.
  8. U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, P. Köster, W. Allers, A. Schwarz, and R. Wiesendanger. Fundamental investigations on point contact friction (German). University of Tübingen, Tübingen, Germany, November 25, 1996.
  9. U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, and R. Wiesendanger. Experimental and theoretical aspects of point contact friction. University of Amsterdam, Amsterdam, The Netherlands, June 27, 1997.
  10. U. D. Schwarz, W. Allers, H. Hölscher, A. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy at low temperatures in UHV. Lawrence Berkeley National Laboratory, University of California, Berkeley, CA, USA, October 16, 1998.
  11. U. D. Schwarz, W. Allers, H. Bluhm, H. Hölscher, A. Schwarz, O. Zwörner, and R. Wiesendanger. Forces and interactions at the atomic scale in scanning force microscopy (German). Seminar talk at the German Electron Synchrotron Facility (DESY), Hamburg, Germany, November 2, 1998.
  12. U. D. Schwarz, W. Allers, H. Hölscher, A. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy at low temperatures: Physical principles and selected results (German). Free University of Berlin, Berlin, Germany, May 7, 1999.
  13. U. D. Schwarz. New applications of scanning force microscopy: From the microscopic origins of friction to high-resolution microscopy/spectroscopy at low temperatures (German). Technical University Aachen, Aachen, Germany, May 10, 1999.
  14. U. D. Schwarz. Friction on the nanometer scale - New insights into an old problem (German). Technical University of Berlin, Berlin, Germany, May 12, 1999.
  15. U. D. Schwarz. Nanomechanics - nanomechanical investigations with the scanning force microscope (German). University of Hamburg, Hamburg, Germany, May 20, 1999.
  16. U. D. Schwarz, A. Schwarz, H. Hölscher, W. Allers, and R. Wiesendanger. Imaging of point defects with the scanning force microscope (German). Martin Luther University Halle-Wittenberg, Halle (Saale), Germany, June 8, 1999.
  17. U. D. Schwarz. Friction on the nanometer scale - New insights into an old problem (German). Technical University of Ilmenau, Ilmenau, Germany, June 14, 1999.
  18. U. D. Schwarz. Measurement of thin film thickness with the scanning force microscope (German). University of Essen, Essen, Germany, June 24, 1999.
  19. U. D. Schwarz. Friction on the nanometer scale - New insights into an old problem (German). University of Hamburg, Hamburg, November 9, 1999.
  20. U. D. Schwarz. New applications of scanning force microscopy: From the microscopic origins of friction to high-resolution microscopy/spectroscopy at low temperatures (German). Federal Institute of Technology Zurich, Zurich, Switzerland, December 16, 1999.
  21. U. D. Schwarz. Structural analysis and spatially resolved measurement of material properties by means of dynamic force microscopy (German). Technical University Aachen, Aachen, Germany, January 15, 2000.
  22. U. D. Schwarz. New applications of scanning force microscopy: From the atomistic origins of friction to high-resolution microscopy/spectroscopy at low temperatures (German). Johannes Gutenberg University Mainz, Mainz, Germany, July 5, 2000.
  23. U. D. Schwarz. Dynamic scanning force microscopy: A new method for highly resolved investigations of solid surfaces. Martin Luther University Halle-Wittenberg, Halle, Germany, December 15, 2000.
  24. U. D. Schwarz. New applications of scanning force microscopy: From the microscopic origins of friction to high-resolution imaging and spectroscopy at low temperatures. International University of Bremen, Bremen, Germany, April 10, 2001.
  25. U. D. Schwarz. New applications of scanning force microscopy. Swiss Federal Institute of Technology Lausanne, Lausanne, Switzerland, April 23, 2001.
  26. U. D. Schwarz. Friction force microscopy. Lawrence Berkeley National Laboratory, University of California, Berkeley, CA, USA, May 14, 2001.
  27. U. D. Schwarz. Dynamic scanning force microscopy at low temperatures in UHV. Lawrence Berkeley National Laboratory, University of California, Berkeley, CA, USA, June 11, 2001.
  28. U. D. Schwarz. Low-temperature scanning force microscopy/spectroscopy. University of California, Irvine, CA, USA, July 27, 2001.
  29. U. D. Schwarz. Low-temperatures scanning force microscopy and -spectroscopy. Swiss Federal Institute of Technology Zurich, Zurich, Switzerland, September 3, 2001.
  30. U. D. Schwarz. Nanomechanical investigations using scanning force microscopy. University of Texas, Austin, TX, USA, November 26, 2001.
  31. U. D. Schwarz: New applications of scanning force microscopy: From the atomistic origins of friction to imaging and spectroscopy at low temperatures (German). University of Karlsruhe, Karlsruhe, Germany, December 21, 2001.
  32. U. D. Schwarz: Nanomechanical investigations using scanning force microscopy. Yale University, New Haven, CT, USA, February 4, 2002.
  33. U. D. Schwarz: Nanomechanical investigations using scanning force microscopy. University of Pennsylvania, Philadelphia, PA, USA, February 14, 2002.
  34. U. D. Schwarz: Friction force microscopy and the atomic origins of friction. Ohio State University, Columbus, OH, USA, March 1, 2002.
  35. U.D. Schwarz. Friction force microscopy and the atomic origins of friction. Université Paris 6-7, Paris, France, October 24, 2002.
  36. U. D. Schwarz. Nanomechanical investigations using scanning force microscopy. Brown University, Providence, RI, USA, March 13, 2003.
  37. U. D. Schwarz. Friction force microscopy and the atomic origins of friction. University of the Antilles and Guyana, Pointe à Pitre, Guadeloupe, France, May 19, 2003.
  38. U. D. Schwarz. High resolution force microscopy at low temperatures. University of the Antilles and Guyana, Pointe à Pitre, Guadeloupe, France, May 19, 2003.
  39. U. D. Schwarz. An analytical model for the adhesive sphere-plane contact and its application in scanning probe microscopy. University of Hamburg, Hamburg, Germany, July 15, 2003.
  40. U. D. Schwarz. Friction force microscopy and the atomic origins of friction. Universtiy of Münster, Münster, Germany, July 18, 2003.
  41. U. D. Schwarz. Nanomechanical investigations using scanning force microscopy. Worchester Polytechnical Institute, Worchester, MA, USA, February 23, 2004.
  42. U. D. Schwarz. Nanomechanical investigations using scanning force microscopy. Johns Hopkins University, Baltimore, MD, USA, March 10, 2004.
  43. U. D. Schwarz. High resolution force microscopy at low temperatures. Boston University, Boston, MA, USA, March 19, 2004.
  44. U. D. Schwarz. Nanomechanical investigations using scanning force microscopy. Purdue University, West Lafayette, IN, USA, August 30, 2004.
  45. U. D. Schwarz. Contact area dependence of frictional forces: Moving adsorbed antimony nanoparticles. Center for Nanotechnology (CeNTech), University of Münster, Münster, Germany, February 11, 2005.
  46. U. D. Schwarz. Contact area dependence of frictional forces: Moving adsorbed antimony nanoparticles. Technical University Aachen, Aachen, Germany, May 2, 2005.
  47. U. D. Schwarz. Energy dissipation at interfaces: Moving adsorbed antimony nanoparticles. University of Duisburg-Essen, Duisburg, Germany, July 12, 2005.
  48. U. D. Schwarz. The contact area dependence of frictional forces: From the contact mechanics of spheres to the translation of adsorbed nanoparticles. Northwestern University, Boston, MA, USA, October 7, 2005.
  49. U. D. Schwarz. Atomic-scale mechanisms of friction: From the Amontons' law to superlubricity. Yale University, November 17, 2006.
  50. U. D. Schwarz. Nanomechanical investigations using scanning force microscopy. Seminar Series of the Yale Society of Physics Students, New Haven, CT, USA, December 8, 2006.
  51. U. D. Schwarz. High-resolution atomic force microscopy. Seminar Series of the Yale Institute of Nanoscience and Quantum Engineering, Yale University, New Haven, CT, USA, February 13, 2007.
  52. U. D. Schwarz. High-resolution atomic force microscopy: Where are we, and where will the future take us? National Institute of Standards and Technology, Geithersburg, MA, USA, March 22, 2007.
  53. U. D. Schwarz. Instrumentation and exemplary results of the Yale Nanomechanics Group. RHK Technology Inc., Troy, MI, USA, September 21, 2007.


3.  Talks Contributed to Conferences and Workshops

1991:

  1. 1. H.-J. Güntherodt, H. Hug, H. P. Lang, T. Jung, U. D. Schwarz, O. Fritz, and M. Wülfert. Relations between microstructure and physical properties of the HTc-superconductors (German). Supra II+ Workshop, Gwatt, Switzerland, January 24-25, 1991.
  2. 2. H. J. Hug, Th. Jung, T. Frey, A. Wadas, U. D. Schwarz, A. Moser, H.-J. Güntherodt, and H. Thomas. Low temperature force microscopy on HTcSC. International Conference on Scanning Tunneling Microscopy, Interlaken, Switzerland, August 12-16, 1991.
  3. Th. Jung, H. Hug, A. Moser, U. D. Schwarz, D. Brodbeck, and R. Hofer. The atomic force microscope as a versatile tool for surface modifications. International Conference on Scanning Tunneling Microscopy, Interlaken, Switzerland, August 12-16, 1991.

1992:

  1. U. D. Schwarz, J. Bohonek, H. Haefke, T. A. Jung, E. Meyer, R. Steiger, and H.-J. Güntherodt. Surface investigations of AgBr microcrystals by means of scanning force microscopy (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 16-20, 1992.
  2. H. Haefke, D. Bürgler, G. Gerth, L. Howald, E. Meyer, U. D. Schwarz, R. Steiger, and G. Tarrach. Micro- and nanostructures on silver halide surfaces: I. Preparation and characterization of AgBr samples (German). Spring Conference of the Swiss Physical Society, Neuchâtel, Switzerland, April 6-8, 1992.
  3. U. D. Schwarz, J. Bohonek, H. Haefke, T. A. Jung, E. Meyer, R. Steiger, and H.-J. Güntherodt. Micro- and nanostructures on silver halide surfaces: II. Morphology of photographic AgBr microcrystals (German). Spring Conference of the Swiss Physical Society, Neuchâtel, Switzerland, April 6-8, 1992.
  4. H. Haefke, U. D. Schwarz, E. Meyer, G. Gerth, R. Steiger, and H.-J. Güntherodt. Topography and sensitization of silver halides studied by scanning force microscopy. International East-West Symposium III: New Frontiers in Silver Halide Imaging, Maui, HI, USA, November 8-13, 1992.

1993:

  1. U. D. Schwarz, J. Bohonek, H. Haefke, W. Sager, R. Steiger, and H.-J. Güntherodt. Atomic force microscopy used for the characterization of precipitated colloidal particles (German). Spring Conference of the Swiss Physical Society, Neuchâtel, Switzerland, March 24-26, 1993.
  2. U. D. Schwarz, J. Bohonek, H. Haefke, W. Sager, R. Steiger, and H.-J. Güntherodt. Investigation of precipitated colloidal particles by scanning force microscopy. 13th General Conference of the Condensed Matter Division of the European Physical Society, Regensburg, Germany, March 29-April 2, 1993.
  3. H. Haefke and U. D. Schwarz. Scanning force microscopy study of surface-sensitized AgBr. 46th Annual Conference of the Society for Imaging Science and Technology, Boston, MA, USA, May 9-14, 1993 (invited).
  4. U. D. Schwarz, W. Sager, H. Haefke, H. Bluhm, and H.-J. Güntherodt. Characterization of nanometer-sized colloidal oxide particles. International Conference on Scanning Tunneling Microscopy, Beijing, China, August 9-13, 1993.

1994:

  1. U. D. Schwarz, W. Allers, G. Gensterblum, R. Johnson, and R. Wiesendanger. Are C60 molecules suitable as molecular ball bearings? Conference of the NATO Advanced Study Institute (ASI) on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994.
  2. U. D. Schwarz, H. Haefke, and H. Fröb. Investigation of the growth of the merocyanine dye MC1 on silver bromide films by means of scanning force microscopy (German). Spring Conference of the German Physical Society, Münster, Germany, March 21-25, 1994.
  3. H. Haefke, U. D. Schwarz, W. Gutmannsbauer, H. Fröb, and H. Böttcher. Aggregation and orientation of merocyanine dye on AgBr surfaces. 47th Annual Conference of the Society for Imaging Science and Technology, Rochester, NY, USA, May 15-20, 1994.

1995:

  1. W. Allers, U. D. Schwarz, G. Gensterblum, J.-J. Pireaux, and R. Wiesendanger. Growth of C60 thin films on GeS(001) studied by scanning force microscopy (German). Spring Conference of the German Physical Society, Berlin, Germany, March 20-24, 1995.
  2. U. D. Schwarz, W. Allers, G. Gensterblum, and R. Wiesendanger. Friction behavior of epitaxially grown C60 monolayers on GeS(001) (German). Spring Conference of the German Physical Society, Berlin, Germany, March 20-24, 1995.
  3. U. D. Schwarz, W. Allers, G. Gensterblum, and R. Wiesendanger. Low-load friction behavior of epitaxial C60 monolayers under Hertzian contact. Eighth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Snowmass, CO, USA, July 23-28, 1995.

1996:

  1. U. D. Schwarz, P. Köster, O. Zwörner, and R. Wiesendanger. Friction force microscopy with well-defined tips on layered materials (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 25-29, 1996.
  2. U. D. Schwarz, P. Köster, O. Zwörner, and R. Wiesendanger. Friction force microscopy with well-defined tips on layered materials (German). Nanoscope User Meeting, Hamburg, Germany, April 18-19, 1996.
  3. U. D. Schwarz, O. Zwörner, P. Köster, and R. Wiesendanger. Friction force microscopy with well-defined tips at layered materials and carbon compounds. NATO ASI workshop on Micro-/Nanotribology and Its Applications, Sesimbra, Portugal, June 16-28, 1996.
  4. U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, P. Köster, and R. Wiesendanger. Nanotribology (German). 171th Seminar of the WE-Heraeus Foundation on Nanosciences and -technology, Bad Honnef, Germany, November 6-7, 1996.

1997:

  1. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. A model for the lateral force microscope (German). Spring Conference of the German Physical Society, Münster, Germany, March 17-21, 1997.
  2. U. D. Schwarz, O. Zwörner, P. Köster, and R. Wiesendanger. Comparative quantitative lateral force microscopy of carbon compounds in air and in argon atmosphere (German). Spring Conference of the German Physical Society, Münster, Germany, March 17-21, 1997.
  3. H. Hölscher, O. Zwörner, and U. D. Schwarz. Consequences of atomic-scale "stick-slip" movement in scanning force microscopy. Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Hamburg, Germany, July 20-25, 1997.
  4. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Atomic resolution at 10 K in UHV with a new design of a scanning force microscope. Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Hamburg, Germany, July 20-25, 1997.
  5. U. D. Schwarz, O. Zwörner, and P. Köster. Validity of contact mechanical models on the nanometer scale with respect to friction force spectroscopy measurements. Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Hamburg, Germany, July 20-25, 1997.

1998:

  1. W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Atomic resolution at 10 K with a new design of a scanning force microscope (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 23-27, 1998.
  2. H. Bluhm, U. D. Schwarz, and R. Wiesendanger. Origin of the ferroelectric domain contrast observed in lateral force microscopy (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 23-27, 1998.
  3. M. Morgenstern, M. Bode, M. Getzlaff, U. D. Schwarz, A. Wadas, and R. Wiesendanger. Nanocharacterisation by scanning probe microscopy. Conference on Nanosciences for Nanotechnology, Hindsgavl, Denmark, May 16-19, 1998 (invited).
  4. W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Atomic resolution on van der Waals surfaces in non-contact mode with a newly designed scanning force microscope for operation in ultrahigh vacuum and at 10 K. First International Workshop on Noncontact Atomic Force Microscopy, Osaka, Japan, July 21-23, 1998.
  5. H. Hölscher, A. Schwarz, U. D. Schwarz, W. Allers, and R. Wiesendanger. Analysis of the frequency shift in non-contact atomic force microscopy. First International Workshop on Noncontact Atomic Force Microscopy, Osaka, Japan, July 21-23, 1998.
  6. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy on InAs(110): Simultaneous resolution of the As and In sublattice and observation of point defects. First International Workshop on Noncontact Atomic Force Microscopy, Osaka, Japan, July 21-23, 1998.
  7. H. Hölscher, A. Schwarz, U. D. Schwarz, W. Allers, and R. Wiesendanger. Towards the understanding of dynamic force microscopy: Analysis of the anharmonic cantilever oscillations. Fifth International Conference on Nanometer-scale Science and Technology (NANO V), Birmingham, England, August 31-September 4, 1998.
  8. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. True atomic resolution on InAs(110) obtained by dynamic scanning force microscopy: Simultaneous Resolution of the As and In sublattice and observation of point defects. Fifth International Conference on Nanometer-scale Science and Technology (NANO V), Birmingham, England, August 31-September 4, 1998.
  9. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Determination of the tip-sample potential from the frequency shift in the dynamic mode of atomic force microscopy. Third Conference on the Development and Technological Application of Nearfield Scanning Probe Methods, Basel, Switzerland, September 14-17, 1998.
  10. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy of point defects on InAs(110)-(1(1) at low temperatures in UHV. Third Conference on the Development and Technological Application of Nearfield Scanning Probe Methods, Basel, Switzerland, September 14-17, 1998.
  11. U. D. Schwarz, W. Allers, H. Hölscher, A. Schwarz, and R. Wiesendanger. Towards the understanding of dynamic scanning force microscopy: Analysis of the contrast mechanism. Third Conference on the Development and Technological Application of Nearfield Scanning Probe Methods, Basel, Switzerland, September 14-17, 1998.

1999:

  1. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Reconstruction of the tip-sample potential from the frequency shift in dynamic mode scanning force microscopy (German). Spring Conference of the German Physical Society, Münster, Germany, March 22-26, 1999.
  2. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Investigation of point defects on InAs(110) by dynamic scanning force microscopy in UHV at low temperatures (German). Spring Conference of the German Physical Society, Münster, Germany, March 22-26, 1999.
  3. H. Hölscher, W. Allers, U. D. Schwarz, and R. Wiesendanger. Analysis of the frequency shift in dynamic force microscopy. Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Seoul, South Korea, July 18-23, 1999.
  4. U. D. Schwarz, W. Allers, H. Hölscher, A. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy in UHV: Physical principles and exemplary experimental results obtained at low temperatures. Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Seoul, South Korea, July 18-23, 1999.
  5. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Simulation of NC-AFM results for graphite(0001). Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, August 31- September 4, 1999.
  6. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Atomic-scale dynamic mode scanning force microscopy study on n-InAs(110)-(1x1) at low temperatures. Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, August 31- September 4, 1999.
  7. U. D. Schwarz, H. Hölscher, and R. Wiesendanger. Towards the understanding of dynamic scanning force microscopy: Analysis of the contrast mechanism and interpretation of atomic-scale images. Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, August 31- September 4, 1999.
  8. W. Allers, A. Schwarz, H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy at low temperatures. Seventh International Conference on Scanning Probe Methods (ICSPM-7), Akagawa, Shizouka, Japan, December 9-11, 1999 (invited).

2000:

  1. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Simulation and analysis of NC-AFM images: Appearance of A- and B-sites on graphite(0001) (German). Spring Conference of the German Physical Society, Hamburg, Germany, March 27-31, 2000.
  2. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. The role of dangling bonds for atomic resolution in the dynamic mode of scanning force microscopy (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 27-31, 2000.
  3. H. Hölscher, B. Gotsmann, A. Schwarz, W. Allers, U. D. Schwarz, H. Fuchs, and R. Wiesendanger. On the measurement of the energy dissipation in dynamic force spectroscopy. Third International Workshop on Non-Contact Atomic Force Microscopy, Hamburg, Germany, July 16-19, 2000.
  4. H. Hölscher and U. D. Schwarz. Friction at the nanometer scale - nanotribology studied with the atomic force microscope. European Symposium on Nanomechanical Testing, Hückelhoven, Germany, November 7-9, 2000 (invited).

2001:

  1. H. Hölscher, B. Gotsmann, U. D. Schwarz, W. Allers, H. Fuchs, and R. Wiesendanger. Measurement of conservative and dissipative tip-sample forces in dynamic force microscopy by the frequency modulation technique (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 26-30, 2001.
  2. H. Hölscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, and R. Wiesendanger. Analysis and Simulation of Dynamic Force Microscopy/Spectroscopy. Eleventh International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Vancouver, Canada, July 15-20, 2001.
  3. A. Schwarz, U. D. Schwarz, S. Langkat, H. Hölscher, W. Allers, and R. Wiesendanger. Dynamic force microscopy at low temperatures. Forth International Workshop on Non-Contact Atomic Force Microscopy, Kyoto, Japan, September 2-5, 2001 (invited).
  4. U. D. Schwarz, H. Hölscher, W. Allers, S. Langkat, B. Gotsmann, H. Fuchs, and R. Wiesendanger. Progress in dynamic force microscopy: From high-resolution imaging of insulators to the measurement of dissipative interaction forces. 48th International Symposium of the American Vacuum Society and 15th International IUVSTA Vacuum Congress, San Francisco, CA, USA, October 29-November 2, 2001.

2002:

  1. U. D. Schwarz. The Frictional Behavior of a Hertzian Contact Analyzed using a New Contact Mechanical Model. 1st ESF-Nanotribology Workshop, Portovenere, Italy, October 19-23, 2002.
  2. U. D. Schwarz. The Frictional Behavior of a Hertzian Contact Analyzed using a New Contact Mechanical Model. 49th International Symposium of the American Vacuum, Denver, CO, USA, November 3-November 9, 2002.

2003:

  1. C.Ritter, M.Heyde, U.D.Schwarz, and K.Rademann. Controlled motion and manipulation of nanometer-sized antimony particles using dynamic force microscopy.Spring Conference of the German Physical Society, Dresden, Germany, March 24-28, 2003.
  2. U. D. Schwarz. A generalized analytical theory for the elastic deformation of an adhesive sphere-plane contact as a model for the tip-sample contact in scanning probe microscopy. Twelfth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Eindhoven, The Netherlands, July 20-25, 2003.
  3. H. Hölscher, B. Anczykowski, and U. D. Schwarz. Theory of Q-controlled dynamic force microscopy. Sixth International Conference on Non-Contact Atomic Force, Dingle, Ireland, August 30-September 3, 2003.

2004:

  1. H. Hölscher, B. Anczykowski, and U. D. Schwarz. Theory of Q-controlled dynamic force microscopy. Annual March Meeting of the American Physical Society, Montréal, Canada, March 22-26, 2004.
  2. C. Ritter, M. Heyde, K. Rademann, and U. D. Schwarz. Adhesion and friction on the nanometer scale: Energy dissipation during sliding of antimony islands on graphite and MoS2. 78th ACS Colloid and Surface Science Symposium, New Haven, CT, USA, June 20-23, 2004.
  3. M. Ashino, A. Schwarz, H. Hölscher, U. D. Schwarz, W. Allers, and R. Wiesendanger. Contrast Formation on Surfaces Composed of Hexagonally Arranged Carbon Atoms. Seventh International Conference on Non-Contact Atomic Force, Seattle, USA, September 12-15, 2004.
  4. U. D. Schwarz, C. Ritter, M. Heyde, and K. Rademann. Contact area dependence of frictional forces: Moving adsorbed antimony nanoparticles. 3rd ESF-Nanotribology Workshop, Sesimbra, Portugal, September 18-22, 2004.

2005:

  1. C. Ritter, U D. Schwarz, Markus Heyde, and K. Rademann. Interface dependent frictional forces: Study of amorphous and crystalline nanoparticles by dynamic scanning force microscopy. Spring Conference of the German Physical Society, Dresden, Germany, March 4-9, 2005.
  2. D. Ebeling, H. Hölscher, U. D. Schwarz, B. Anczykowski, and H. Fuchs. Q-Control in dynamic force microscopy (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 4-9, 2005.
  3. U. D. Schwarz, C. Ritter, M. Heyde, and K. Rademann. Contact area dependence of frictional forces: Moving adsorbed antimony nanoparticles. Annual March Meeting of the American Physical Society, Los Angeles, CA, USA, March 20-25, 2005.
  4. U. D. Schwarz, C. Ritter, M. Heyde, and K. Rademann. On the influence of structure on friction: The amorphous-crystalline transition in antimony nanoparticles. 4th ESF-Nanotribology Workshop, Porquerolles, France, June 18-22, 2005.
  5. U. D. Schwarz. A generalized analytical model for the elastic deformation of an adhesive contact between a sphere and a flat surface. World Tribology Congress III, Washington, D.C., USA, September 12-16, 2005.
  6. U. D. Schwarz, C. Ritter, M. Heyde, and K. Rademann. Adhesion and friction on the nanometer scale: Energy dissipation during sliding of antimony islands on graphite and MoS2. World Tribology Congress III, Washington, D.C., USA, September 12-16, 2005.
  7. T. König, D. Braun, B. Albers, J. Falter, A. Schirmeisen, H. Hölscher, H. Fuchs, M. Heyde, M. Liebmann, and U. D. Schwarz. Construction of an NC-AFM Combined with a Field Ion Microscope. NRW-Mitarbeitertreffen Oberflächephysik- und Chemie, Bonn, Germany, September 19, 2005.
  8. C. Ritter, M. Heyde, K. Rademann, and U. D. Schwarz. On the influence of structure on friction: The amorphous-crystalline transition in antimony nanoparticles. 52nd International Symposium of the American Vacuum, Boston, MA, USA, October 30-November 4, 2005.

2006:

  1. C. Ritter, M. Heyde, K. Rademann, and U. D. Schwarz. Relating structure and friction: Energy dissipation during the lateral manipulation of antimony nanoparticles. Spring Conference of the German Physical Society, Dresden, Germany, March 27-31, 2006.
  2. D. Ebeling, H. Hölscher, H. Fuchs, and U. D. Schwarz. Theoretical analysis of Q-controlled dynamic force microscopy in ambient conditions. Spring Conference of the German Physical Society, Dresden, Germany, March 27-31, 2006.
  3. D. Braun, T. König, J. Falter, A. Schirmeisen, H. Hölscher, M. Liebmann, U. D. Schwarz, and H. Fuchs.Towards the analysis of force interactions of atomically defined tip-sample contacts. Spring Conference of the German Physical Society, Dresden, Germany, March 27-31, 2006.
  4. U. D. Schwarz, C. Ritter, M. Heyde, and K. Rademann. Relating structure and friction: Energy dissipation during the lateral manipulation of antimony nanoparticles. Annual March Meeting of the American Physical Society, Baltimore, MD, USA, March 12-17, 2006.
  5. H. Hölscher and U. D. Schwarz. Theory of Q-Controlled Dynamic Force Microscopy in Liquids. Annual March Meeting of the American Physical Society, Baltimore, MD, USA, March 12-17, 2006.
  6. U. D. Schwarz, H. Hölscher, and D. Ebeling. The quest for high resolution in air and liquids: The role of tip-sample forces in Q-controlled force microscopy. Ninth International Conference on Non-Contact Atomic Force, Kobe, Japan, July 17-20, 2006.
  7. U. D. Schwarz, C. Ritter, M. Heyde, and K. Rademann. A new experimental approach to nanotribology: Energy dissipation measurements during particle sliding. International Conference on Nanoscience and Technology, Basel, Switzerland, July 30-August 4, 2006.
  8. D. Dietzel, A. Schirmeisen, H. Fuchs, and U. D. Schwarz. Manipulation of nanometer-scale metallic islands in ultrahigh vacuum by atomic force microscopy techniques. International Conference on Nanoscience and Technology, Basel, Switzerland, July 30-August 4, 2006.

2007:

  1. D. Dietzel, T. Mönninghoff, A. Schirmeisen, H. Fuchs, and U. D. Schwarz.Contact area dependence of friction on the nanoscale. Spring Conference of the German Physical Society, Regensburg, Germany, March 26-30, 2007.
  2. A. Schirmeisen, D. Dietzel, T. Mönninghoff, H. Fuchs, and U. D. Schwarz. Friction experiments by manipulation of nanoscale metallic islands in ultrahigh vacuum: From Amontons‘ law to superlubricity. 6th ESF-Nanotribology Workshop, Santa Margaritha di Pula, Sardinia, Italy, May 12-16, 2007.
  3. U. D. Schwarz, C. Ritter, B. Stegemann, M. Heyde, K. Rademann, D. Dietzel, A. Schirmeisen, and H. Fuchs. Frictional properties of antimony nanoparticles: The influence of contact area, structure, and surface contamination. STLE/ASME International Joint Tribology Conference, San Diego, CA, USA, October 22-24, 2007.

2008:

  1. D. Dietzel, U. D. Schwarz, C. Ritter, H. Fuchs, and A. Schirmeisen. Udo D. Schwarz. Interfacial friction analyzed by lateral manipulation of metallic nanoparticles. Spring Conference of the German Physical Society, Berlin, Germany, February 25-29, 2008.
  2. U. D. Schwarz, D, Dietzel, C. Ritter, T. Mönninghoff, H. Fuchs, and A. Schirmeisen. The duality of nanoscale friction: Amontons’ law vs. superlubricity. Annual March Meeting of the American Physical Society, New Orleans, LA, USA, March 10-14, 2008.
  3. B. J. Albers, T. C. Schwendemann, M. Z. Baykara, N. Pilet, and U. D. Schwarz. Measurement of lateral tip-sample forces in the attractive regime with picometer resolution in three dimensions. Annual March Meeting of the American Physical Society, New Orleans, LA, USA, March 10-14, 2008.
  4. A. Schirmeisen, D. Dietzel, T. Mönninghoff, C. Ritter, and U. D Schwarz. The dual nature of nanoscale friction: Amontons' law vs. superlubricity. Spring Meeting of the Materials Research Society, San Francisco, CA, USA, March 24-28, 2008.
  5. U. D. Schwarz, B. J. Albers, T. C. Schwendemann, M. Z. Baykara, C. A. F. Vaz, N. Pilet, and E. I. Altman. Atomic resolution imaging and quantification of chemical functionality of surfaces. 2008 Analysis, Imaging, and Separations Research Meeting of the U. S. Department of Energy, Annapolis, MD, USA, May 4-7, 2008.
  6. Y. Yun, E. I. Altman, N. Pilet, and U. D. Schwarz. Can ferroelectric polarization be used to manipulate metal-support interactions? 30th Annual Symposium on Applied Surface Analysis, University Park, PA, USA, June 11-13, 2008.
  7. U. D. Schwarz, B. J. Albers, T. C. Schwendemann, M. Z. Baykara, N. Pilet, and E. I. Altman. Three-Dimensional Force Imaging and Quantification with Atomic Resolution. Eleventh International Conference on Noncontact Atomic Force, Madrid, Spain, September 15-19, 2008.
  8. C. A. F. Vaz, H.-Q. Wang, C. H. Ahn, V. E. Henrich, M. Z. Baykara, T. C. Schwendemann, N. Pilet, B. J. Albers, U. D. Schwarz, L. H. Zhang, Y. Zhu, J. Wang, and E. I. Altman. Interface and electronic characterization of thin epitaxial Co3O4 films. 55th International Symposium of the American Vacuum Society, Boston, MA, USA, October 19-24, 2008.
  9. T. C. Schwendemann, B. J. Albers, M. Z. Baykara, N. Pilet, E. I. Altman, and U. D. Schwarz. Examination of Force Interactions on Surfaces with Atomic Resolution Using Noncontact Atomic Force Microscopy. 55th International Symposium of the American Vacuum Society, Boston, MA, USA, October 19-24, 2008.
  10. Y. Yun, E. I. Altman, N. Pilet, and U. D. Schwarz. Manipulating metal-support interactions via the ferroelectric effect. Annual Meeting of the American Institute of Chemical Engineers, Philadelphia, PA, USA, November 16-21, 2008.


4.  Posters

1991:

  1. L. Howald, H. Haefke, E. Meyer, R. Overney, U. Schwarz, G. Gerth, and H.-J. Güntherodt. The surface of silver bromide crystals studied with the atomic force microscope . Nanoscope User Conference, Mulhouse, France, July 1991.
  2. T. A. Jung, H. Hug, A. Moser, U. Schwarz, D. Brodbeck, and E. Meyer. Atomic force microscopy used for controlled mechanical experimentation at surfaces: Micro indentation hardness and wear experiments. International Conference on Scanning Tunneling Microscopy, Interlaken, Switzerland, August 12-16, 1991.
  3. A. Moser, U. Schwarz, H. J. Hug, Th. Jung, A. Wadas, D. Brodbeck, and H.-R. Hidber. A high stability and low drift AFM. International Conference on Scanning Tunneling Microscopy, Interlaken, Switzerland, August 12-16, 1991.
  4. U. D. Schwarz, Th. Jung, and H. Hug. Atomic force microscopy of precipitated colloidal particles: Silver bromide tabular grains. International Conference on Scanning Tunneling Microscopy, Interlaken, Switzerland, August 12-16, 1991.

1993:

  1. H. Bluhm, U. D. Schwarz, G. Wagner, and P. Paufler. Relations between surface topology and micromechanics in mechanically deformed, epitaxially grown semiconducting films (German). 31th Annual Conference of the German Society for Crystallography, Bochum, Germany, March 10-12, 1993.
  2. G. Klöss, H. Bluhm, K. Jurkschat, U. D. Schwarz, and P. Paufler. Investigation of the topology of single slip lines in zinc blende-type structures by scanning force microscopy (German). 31th Annual Conference of the German Society for Crystallography, Bochum, Germany, March 10-12, 1993.
  3. H. Bluhm, U. D. Schwarz, G. Wagner, and P. Paufler. Relations between surface morphology and micromechanics in stress relaxed single heteroepitaxial layers. 13th General Conference of the Condensed Matter Division of the European Physical Society, Regensburg, Germany, March 29-April 2, 1993.
  4. W. Sager, U. D. Schwarz, H. Haefke, H.-J. Güntherodt, and H.-F. Eicke. Preparation and characterization of colloidal oxide particles. Conference on Colloids and Interfaces, Swiss Group of Colloids and Interface Science (SGCIS), Bern, Switzerland, April 1-2, 1993.
  5. U. D. Schwarz, H. Haefke, J. Bohonek, R. Steiger, and H.-J. Güntherodt. Habit and morphology of precipitated AgBr emulsion particles studied with scanning force microscopy. Conference on Colloids and Interfaces, Swiss Group of Colloids and Interface Science (SGCIS), Bern, Switzerland, April 1-2, 1993.
  6. H. Bluhm, U. D. Schwarz, G. Wagner, V. Gottschalch, G. Klöss, K. Jurkschat, P. Paufler, and H.-J. Güntherodt. Topography of epitaxial layers on semiconductors investigated by scanning force microscopy in air. International Conference on Scanning Tunneling Microscopy, Beijing, China, August 9-13, 1993.
  7. U. D. Schwarz, H. Haefke, G. Gerth, H. Fröb, R. Steiger, and H.-J. Güntherodt. Topography, sensitization and exposure of silver halides studied by scanning force microscopy. International Conference on Scanning Tunneling Microscopy, Beijing, China, August 9-13, 1993.
  8. U. D. Schwarz, H. Haefke , and H.-J. Güntherodt. An interferometer-based atomic force microscope for measurement in fluids and gases International Conference on Scanning Tunneling Microscopy, Beijing, China, August 9-13, 1993.
  9. H. Bluhm, U. D. Schwarz, G. Wagner, V. Gottschalch, and P. Paufler. Surface topography due to growth and relaxation of InGaAs and InGaP single heteroepitaxial layers. IUCr-Conference, Beijing, China, August 23-29, 1993.
  10. W. Sager and U. D. Schwarz. Characterization of colloidal oxide particles precipitated in emulsions. 7th ECIS Conference, Bristol, UK, September 12-16, 1993.

1994:

  1. W. Allers, U. D. Schwarz, G. Gensterblum, R. Johnson, and R. Wiesendanger. Can C60 molecules be used as microscopic ball bearing? (German). Spring Conference of the German Physical Society, Münster, Germany, March 21-25, 1994.
  2. W. Allers, U. D. Schwarz, G. Gensterblum, and R. Wiesendanger. Scanning force microscopy study of the early stages of growth of C60 molecules on GeS (German). Spring Conference of the German Physical Society, Münster, Germany, March 21-25, 1994.
  3. S. Lukas, U. D. Schwarz, M. Löhndorf, and R. Wiesendanger. Procedures for nanostructuring under ambient conditions by means of scanning probe methods (German). Spring Conference of the German Physical Society, Münster, Germany, March 21-25, 1994.
  4. U. D. Schwarz, H. Haefke, and P. Reimann. Tip artefacts in scanning force microscopy (German). Spring Conference of the German Physical Society, Münster, Germany, March 21-25, 1994.
  5. W. Gutmannsbauer, H. Haefke, U. D. Schwarz, H.-J. Güntherodt, and R. Steiger. Characterization of silver halide microcrystals by atomic force microscopy. 47th Annual Conference of the Society for Imaging Science and Technology, Rochester, NY, USA, May 15-20, 1994.

1995:

  1. P. Köster, U. D. Schwarz, and R. Wiesendanger. Issues related with the quantitative analysis of friction force microscopy data (German). Spring Conference of the German Physical Society, Berlin, Germany, March 20-24, 1995.
  2. A. Schwarz, U. D. Schwarz, H. Bluhm, W. Sager, and R. Wiesendanger. Growth of a-Fe2O3 nanocrystallites on a a-Al2O3(0001) substrate (German). Spring Conference of the German Physical Society, Berlin, Germany, March 20-24, 1995.
  3. A. Schwarz, U. D. Schwarz, H. Bluhm, and R. Wiesendanger. Determination of Miller indices of side faces of small crystallites from scanning force microscopy angle measurements (German). Spring Conference of the German Physical Society, Berlin, Germany, March 20-24, 1995.
  4. W. Allers, U. D. Schwarz, G. Gensterblum, J.-J. Pireaux, and R. Wiesendanger. Growth of C60 thin films on GeS(001) studied by scanning force microscopy. Eighth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Snowmass, CO, USA, July 23-28, 1995.

1996:

  1. M. Seider, U. D. Schwarz, and R. Wiesendanger. Loading-force dependent studies of topography and friction of particle traces in mica by means of scanning probe methods (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 25-29, 1996.
  2. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Simulation of the measuring process in friction force microscopy (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 25-29, 1996.
  3. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Simulation of atomic-scale processes in friction force microscopy. NATO ASI workshop on Micro-/Nanotribology and Its Applications, Sesimbra, Portugal, June 16-28, 1996.
  4. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Modelling of the scan process in friction force microscopy (German). 167th Seminar of the WE-Heraeus Foundation on Non-linear Physics of Complex Systems, Bad Honnef, Germany, November 4-6, 1996.

1997:

  1. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Consequences of the "stick-slip" movement in scanning force microscopy (German). Spring Conference of the German Physical Society, Münster, Germany, March 17-21, 1997.
  2. O. Zwörner, U. D. Schwarz, H. Hölscher, and R. Wiesendanger. Force spectroscopical measurements of the velocity dependence of lateral forces (German). Spring Conference of the German Physical Society, Münster, Germany, March 17-21, 1997.
  3. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Simulation of a scanned tip in scanning force microscopy. European Workshop on Microtechnology and Scanning Probe Microscopy, Mainz, Germany, April 7-9, 1997.
  4. U. D. Schwarz, O. Zwörner, P. Köster, and R. Wiesendanger. Quantitatively reproducible measurement of frictional forces in scanning force microscopy using well-defined tips. European Workshop on Microtechnology and Scanning Probe Microscopy, Mainz, Germany, April 7-9, 1997.
  5. H. Hölscher, O. Zwörner, and U. D. Schwarz. The velocity dependence of frictional forces in scanning force microscopy. Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Hamburg, Germany, July 20-25, 1997.
  6. O. Zwörner, U. D. Schwarz, and R. Wiesendanger. Quantitative analysis of the frictional properties of carbon compounds at low temperatures using friction force spectroscopy. Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Hamburg, Germany, July 20-25, 1997.

1998:

  1. H. Hölscher, U. D. Schwarz, A. Schwarz, W. Allers, O. Zwörner, and R. Wiesendanger. Analysis of nonlinear dynamics in scanning force microscopy. 186th WE-Heraeus Seminar on Statistical Mechanics, Nonlinear Dynamics and Turbulence, Marburg, Germany, February 9-11, 1998.
  2. J. H. Müller, U. D. Schwarz, and R. Wiesendanger. Design of a cryogenic scanning force microscope for the characterization of frozen biological samples (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 23-27, 1998.
  3. U. D. Schwarz, H. Hölscher, W. Raberg, A. Hasbach, R. Wiesendanger, and K. Wandelt. Analysis of the atomic-scale imaging process in contact scanning force microscopy (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 23-27, 1998.
  4. J. H. Müller, U. D. Schwarz, and R. Wiesendanger. Design of a cryogenic scanning force microscope for the characterization of frozen biological samples. 3rd Conference on the Development and Technological Application of Nearfield Scanning Probe Methods, Basel, Switzerland, September 14-17, 1998.
  5. J. H. Müller, U. D. Schwarz, and R. Wiesendanger. Design of a cryogenic scanning force microscope for the characterization of frozen biological samples (German). Workshop on Scanning Probe Methods and Organic Materials VII, Berlin, Germany, October 7-9, 1998.

1999:

  1. H. Hölscher, A. Schwarz, U. D. Schwarz, W. Allers, and R. Wiesendanger. Analysis of the frequency shift in dynamic scanning force microscopy (German). Spring Conference of the German Physical Society, Münster, Germany, March 22-26, 1999.
  2. U. D. Schwarz, H. Hölscher, and R. Wiesendanger. Analysis of the contrast mechanism in dynamic scanning force microscopy (German). Spring Conference of the German Physical Society, Münster, Germany, March 22-26, 1999.
  3. W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy at low temperatures on van der Waals surfaces: graphite (0001) and xenon (111). Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Seoul, South Korea, July 18-23, 1999.
  4. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Point defects on cleaved n-InAs(110)-(1x1) investigated with dynamic scanning force microscopy in ultrahigh vacuum and at low temperatures. Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Seoul, South Korea, July 18-23, 1999.
  5. W. Allers, H. Hölscher, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Analysing the tip-sample interaction in dynamic mode scanning force microscopy. Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, August 31- September 4, 1999.
  6. A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Screened Coulomb potentials of doping atoms in InAs detected by scanning force microscopy in the dynamic mode. Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, August 31- September 4, 1999.

2000:

  1. T. Richter, J. H. Müller, U. D. Schwarz, and R. Wiesendanger. Investigation of the swelling of human skin cells in different media by means of scanning force microscopy. Digital Instruments-Vecco User Meeting, Mainz, Germany, March 14-16, 2000.
  2. W. Allers, H. Hölscher, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Analysis of the tip-sample interaction in dynamic mode scanning force microscopy (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 27-31, 2000.
  3. S. Langkat, W. Allers, U. D. Schwarz, and R. Wiesendanger. Low temperature scanning force microscope with three-dimensional sample positioning stage and atomic resolution (German). Spring Conference of the German Physical Society, Regensburg, Germany, March 27-31, 2000.
  4. T. Richter, J. H. Müller, U. D. Schwarz, and R. Wiesendanger. Investigation of the swelling of human skin cells in different media by means of scanning force microscopy. Spring Conference of the German Physical Society, Regensburg, Germany, March 27-31, 2000.
  5. J. H. Müller, U. D. Schwarz, and R. Wiesendanger. Scanning force microscopy in non-contact mode for the characterization of biological samples. Spring Conference of the German Physical Society, Regensburg, Germany, March 27-31, 2000.
  6. H. Hölscher, W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Interpretation of "true atomic" resolution images in non-contact atomic force microscopy. Third International Workshop on Non-Contact Atomic Force Microscopy, Hamburg, Germany, July 16-19, 2000.
  7. J. H. Müller, U. D. Schwarz, R. Wepf, and R. Wiesendanger. A cryogenic scanning force microscope for the imaging of frozen biological samples in non-contact mode. Third International Workshop on Non-Contact Atomic Force Microscopy, Hamburg, Germany, July 16-19, 2000.
  8. T. Richter, J. H. Müller, U. D. Schwarz, and R. Wiesendanger. Investigation of the swelling of human skin cells in liquid media by tapping mode scanning force microscopy. Third International Workshop on Non-Contact Atomic Force Microscopy, Hamburg, Germany, July 16-19, 2000.
  9. H. Hölscher, W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Determination and analysis of tip-sample interaction forces by dynamic force spectroscopy. Second International Conference on Scanning Probe Spectroscopy, Hamburg, Germany, July 16-19, 2000.

2003:

  1. M. Heyde, A. Mugarza, T. Shimizu, Y. Qi, F. Ogletree, M. Salmeron, and U. D. Schwarz. Design of a low temperature STM/DFM. Nanoscience and Bionanoscience Research Meeting, Berkeley, CA, USA, June 11, 2003.
  2. U. D. Schwarz. Nanomechanical investigations with the scanning force microscope. Workshop of the American Science Foundation on Nanoscale Mechanical Engineering, Arlington, VA, USA, June 15-16, 2003.
  3. M. Heyde, A. Mugarza, T. Shimizu, Y. Qi, F. Ogletree, M. Salmeron, and U. D. Schwarz. Design of a low temperature STM/DFM. Sixth International Conference on Non-Contact Atomic Force, Dingle, Ireland, August 30-September 3, 2003.

2004:

  1. D. Ebeling, H. Hölscher, B. Anczykowski, U. D. Schwarz, and H. Fuchs. Analysis of Q-controlled dynamic force microscopy. 13th Conference on Scanning Probe Microscopies and Organic Materials, Bielefeld, Germany, September 6-8, 2004.
  2. C. Ritter, M. Heyde, B. Stegemann, K. Rademann, and U. D. Schwarz. Moving adsorbed nanoparticles by scanning force microscopy: A new gateway to the study of nanoscale frictional properties. 3rd ESF-Nanotribology Workshop, Sesimbra, Portugal, September 18-22, 2004.

2005:

  1. C. Ritter, U. D. Schwarz, B. Stegemann, M. Heyde, and K. Rademann. Tribological properties of amorphous and crystalline antimony nanoparticles studied by SFM and TEM. Spring Conference of the German Physical Society, Regensburg, Germany, March 4-9, 2005.
  2. D. Braun, A. Schirmeisen, H. Hölscher, H. Fuchs, U. D. Schwarz, M. Liebmann, and M. Heyde. Construction of an atomic force microscope combined with an field ion microscope. Spring Conference of the German Physical Society, Regensburg, Germany, March 4-9, 2005.
  3. D. Braun, B. Albers, J. Falter, T. König, A. Schirmeisen, H. Hölscher, H. Fuchs, M. Heyde, M. Liebmann, and U. D. Schwarz. Construction of an atomic force microscope combined with an field ion microscope. Thirteenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Sapporo, Japan, July 3-8, 2005.
  4. D. Braun, B. Albers, J. Falter, A. Schirmeisen, H. Hölscher, H. Fuchs, M. Heyde, M. Liebmann, and U. D. Schwarz. Construction of an atomic force microscope combined with an field ion microscope. Eighth International Conference on Non-Contact Atomic Force, Bad Essen, Germany, August 15-18, 2005.
  5. D. Ebeling, H. Hölscher, H. Fuchs, B. Anczykowski, and U. D. Schwarz. Analysis of Q-controlled dynamic force microscopy in air and liquids. Eighth International Conference on Non-Contact Atomic Force, Bad Essen, Germany, August 15-18, 2005.

2006:

  1. T. König, D. Braun, J. Falter, A. Schirmeisen, H. Hölscher, M. Liebmann, U. D. Schwarz, and H. Fuchs. Design of a low temperature tuning fork atomic force microscope combined with a field ion microscope. Spring Conference of the German Physical Society, Dresden, Germany, March 27-31, 2006.
  2. D. Dietzel, A. Schirmeisen, H. Fuchs, and U. D. Schwarz. Manipulation of nanometer-scale metallic islands in ultrahigh vacuum by dynamic force microscopy techniques. Spring Conference of the German Physical Society, Dresden, Germany, March 27-31, 2006.
  3. C. Ritter, M. Heyde, B. Stegemann, K. Rademann, and U. D. Schwarz. A new experimental approach to nanotribology: Energy dissipation measurements during particle sliding. Gordon Conference on Trobology, Waterville, ME, USA, June 18-23, 2006.
  4. B. Albers, A. Mugarza, T. Shimizu, M. Heyde, F. Ogletree, M. Liebmann, M. Salmeron, and U. D. Schwarz. High-Resolution Combined Low-Temperature Scanning Tunneling/Atomic Force Microscope with In-Situ Tip and Sample Exchange. International Conference on Nanoscience and Technology, Basel, Switzerland, July 30-August 4, 2006.
  5. U. D. Schwarz, H. Hölscher, and D. Ebeling. The quest for high resolution in air and liquids: Tip-sample forces in Q-controlled force microscopy. International Conference on Nanoscience and Technology, Basel, Switzerland, July 30-August 4, 2006.
  6. C. Ritter, M. Heyde, B. Stegemann, K. Radamann, and U. D. Schwarz. A new SPM-based approach to nanotribology: Energy dissipation measurements during particle sliding. Workshop "Frontiers in Scanning Probe Microscopy", West Lafayette, IN, USA, October 4-6, 2006.

2007:

  1. J. Londa, J. Lehman, A. Lehman, C. Caragianis-Broadbridge, B. Stegemann, K. Rademann, C. Ritter, and U. D. Schwarz. Characterization of Vapor Deposited Antimony Nanoparticles on HOPG and MoS2 by Scanning Force Microscopy. Annual March Meeting of the American Physical Society, Denver, CO, USA, March 5-9, 2007.
  2. D. Braun, J. Falter, A. Schirmeisen, H. Hölscher, U. D. Schwarz, and H. Fuchs. Force interactions in atomically defined tip-sample contacts. Spring Conference of the German Physical Society, Regensburg, Germany, March 26-30, 2007.
  3. T. Mönninghoff, D. Dietzel, A. Schirmeisen, H. Fuchs, and U. D. Schwarz. Strategies for manipulation of nanometer-scale metallic islands in ultrahigh vacuum by atomic force microscopy techniques. Spring Conference of the German Physical Society, Regensburg, Germany, March 26-30, 2007.
  4. B. J. Albers, T. Schwendemann, M. Baykara, C. A. F. Vaz, J. Wang, E. I. Altman, and U. D. Schwarz. Atomic Resolution Imaging and Quantification of Chemical Functionality of Surfaces. “Frontiers in Interfacial and Nanocatalysis”-Meeting of the Catalysis and Chemical Transformation Program, US Department of Energy, Wintergreen, VA, USA, May 23-26, 2007.
  5. B. J. Albers, T. Schwendemann, M. Z. Baykara, N. Pilet, M. Heyde, M. Liebmann, and U. D. Schwarz. High-resolution combined scanning tunneling/atomic force microscope for 3D force spectroscopy. Tenth International Conference on Non-contact Atomic Force Microscopy, Antalya, Turkey, September 16-20, 2007.

2008:

  1. B. J. Albers, T. Schwendemann, M. Z. Baykara, N. Pilet, M Liebmann, M. Heyde, and U. D. Schwarz. High-Resolution Combined Low-Temperature Scanning Tunneling/Atomic Force Microscope for 3D Force Spectroscopy. Spring Conference of the German Physical Society, Berlin, Germany, February 25-29, 2008.
  2. T. Mönninghoff, D. Dietzel, L. Jansen, H. Fuchs, U. D. Schwarz, and A. Schirmeisen. Strategies for measuring interfacial friction by lateral manipulation of nanoparticles using atomic force microscopy techniques. Spring Conference of the German Physical Society, Berlin, Germany, February 25-29, 2008.
  3. D. Braun, J. Falter, Th. König, A. Schirmeisen, H. Hölscher, U. D. Schwarz, and H. Fuchs. Characterization of W-Tips used in Tuning-Fork Non-Contact Atomic Force Microscopy by Field Ion Microscopy. Spring Conference of the German Physical Society, Berlin, Germany, February 25-29, 2008.
  4. B. J. Albers, M. Liebmann, T. C. Schwendemann, M. Z. Baykara, M. Heyde, M. Salmeron, E. I. Altman, and U. D. Schwarz. High-resolution combined low-temperature scanning tunneling/atomic force microscope of 3D force spectroscopy. Annual March Meeting of the American Physical Society, New Orleans, LA, USA, March 10-14, 2008.
  5. H. Hölscher, D. Ebeling, U. D. Schwarz. Atomic-scale friction at surface steps: Theory and experiment. Gordon Conference on Tribology, Waterville, ME, USA, July 6-11, 2008.
  6. M. Z. Baykara, B. J. Albers, T. C. Schwendemann, N. Pilet, and U. D. Schwarz. Measurement of lateral tip-sample forces in the attractive regime with picometer resolution in three dimensions using NC-AFM. Eleventh International Conference on Noncontact Atomic Force, Madrid, Spain, September 15-19, 2008.

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