Dr. Jun-Fei Zheng
Visiting Fellow

Becton Center #314
Department of Electrical Engineering
Yale University
New Haven, CT 06520
Lab phone: 203-432-4207
Email: jun-fei.zheng@yale.edu

Summary

Jun-Fei Zheng is an Intel Visiting Fellow at Yale University. He received a Ph.D. degree in materials science from the University of California at Berkeley in 1994. Since then he has been with Intel Corporation working on IC process technology development in the areas including gate dielectric, MOS transistor scaling and integration, novel memory devices, Silicon chip compatible optical interconnects, III-V semiconductor based optoelectronic devices and their applications in high speed optical network. Currently, he is Senior Staff Scientist and project manager with the Intel Strategic Technology Group working on nano technology and emerging research devices.

He has co-authored more than 30 refereed journal and conference papers. He holds15 issued U.S. Patents within the areas of Semiconductor processing, CMOS transistors, optoelectronics, and optical lithography.