Weipeng Li
Graduate Student and Research Assistant

Becton Center #319
Department of Electrical Engineering
Yale University
New Haven, CT 06520
Lab phone: 203-432-4209
Email: weipeng.li@yale.edu

Research Summary

Process and characterization of Advanced Silicon nitride and high-K gate dielectrics on compound semiconductor MIS devices for applications on high speed computation to extend the scaling limit of traditional Si devices.

Research tools range from device fabrication to physical and electrical characterization, including cleanroom process, ellipsometry, CV, IV, Charge pumping and others.